Visual identification of photovoltaic panels

What is PVL-AD dataset for photovoltaic panel defect detection?

To meet the data requirements, Su et al. 18 proposed PVEL-AD dataset for photovoltaic panel defect detection and conducted several subsequent studies 19, 20, 21 based on this dataset. In recent years, the PVEL-AD dataset has become a benchmark for photovoltaic (PV) cell defect detection research using electroluminescence (EL) images.

Can El images be used for photovoltaic panel defect detection?

Buerhop et al. 17 constructed a publicly available dataset using EL images for optical inspection of photovoltaic panels. Based on this dataset, researchers have developed numerous algorithms 9, 10, 12 for photovoltaic panel defect detection.

How machine vision is used in photovoltaic panel defect detection?

Machine vision-based approaches have become an important direction in the field of defect detection. Many researchers have proposed different algorithms 11, 15, 16 for photovoltaic panel defect detection by creating their own datasets.

How can El imaging be used to inspect photovoltaic modules?

One approach uses a support vector machine for fast results on mobile hardware. The second method with a convolutional neural network achieves even higher accuracy. Both methods allow continuous monitoring for defects that affect the cell output. Electroluminescence (EL) imaging is a useful modality for the inspection of photovoltaic (PV) modules.

Can El images be automatically detected in a PV cell?

However, the analysis of EL images is typically a manual process that is expensive, time-consuming, and requires expert knowledge of many different types of defects. In this work, we investigate two approaches for automatic detection of such defects in a single image of a PV cell.

What are the different types of defects in PV panels?

As illustrated in Fig. 1, the common types of defects in PV panels include crack, finger interruption, black core, thick line, star crack, corner, horizontal dislocation, vertical dislocation, and short circuit often accompanied by complex background interference. However, defect detection in EL images requires highly specialized knowledge.